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Fluorescence intensity correction method, fluorescence intensity calculation method and fluorescence intensity calculation apparatus and fluorescence intensity correction program

机译:荧光强度校正方法,荧光强度计算方法以及荧光强度计算装置和荧光强度校正程序

摘要

PROBLEM TO BE SOLVED: To provide a fluorescence correction method capable of performing highly accurate fluorescence correction.;SOLUTION: The method includes: a procedure S30 for obtaining a plurality of fluorescence spectrums of fluorescence dyes as one spectrum group; a procedure S50 for dividing the spectrum group into a plurality of small spectrum groups; a procedure S60 for comparing the small spectrum groups with reference data to specify them as a fluorescence spectrum of any dye, and comparing a difference spectrum between a small spectrum group unspecified as a fluorescence spectrum of any dye and one or more specified small spectrum groups with reference data of the unspecified dye to specify it as a fluorescence spectrum of any dye; and a procedure S70 for calculating fluorescence intensity from each dye about the small spectrum groups or dyes whose difference spectrum is specified by using the fluorescence wavelength distribution thereof, and about an unspecified dyes by using the reference data.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种能够执行高精度的荧光校正的荧光校正方法。解决方案:该方法包括:步骤S30,用于获得荧光染料的多个荧光光谱作为一个光谱组;步骤S50,将频谱组划分为多个小频谱组;步骤S60,将小光谱组与参考数据进行比较以将其指定为任何染料的荧光光谱,并将未指定为任何染料的荧光光谱的小光谱组与一个或多个指定的小光谱组之间的差异光谱进行比较,未指定染料的参考数据,以将其指定为任何染料的荧光光谱;程序S70,用于计算每种染料关于小光谱组或通过使用其荧光波长分布指定了不同光谱的染料以及关于未指定染料通过使用参考数据得到的荧光强度。COPYRIGHT:(C)2012,日本特许厅

著录项

  • 公开/公告号JP5494351B2

    专利类型

  • 公开/公告日2014-05-14

    原文格式PDF

  • 申请/专利权人 ソニー株式会社;

    申请/专利号JP20100186949

  • 发明设计人 酒井 啓嗣;

    申请日2010-08-24

  • 分类号G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 16:15:23

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