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Film forming method, film forming apparatus, a piezoelectric film, a piezoelectric element, a liquid ejection apparatus, and a piezoelectric ultrasonic transducer

机译:膜形成方法,膜形成装置,压电膜,压电元件,液体喷射装置以及压电超声换能器

摘要

PROBLEM TO BE SOLVED: To provide a film formation method capable of sophisticatedly unifying the film characteristic such as the composition in the in-plane direction irrespective of the composition of a film to be deposited and the size of a substrate.;SOLUTION: When a film containing constituent elements of a target T is formed on a substrate B through a vapor deposition process using plasma with placing the substrate B and the target T to face each other, the potential in a spatial range of at least 10 mm extending laterally from the outer circumference of the substrate B is controlled to be equal to the potential on the substrate B, and/or the substrate B is surrounded with a wall surface 10S having the potential controlled to be equal to the potential on the substrate B.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种成膜方法,其能够精细地统一膜特性,例如在面内方向上的组成,而与待沉积的膜的组成和基板的尺寸无关。通过使用等离子体的汽相淀积工艺在衬底B上形成包含靶T的构成元素的膜,同时将衬底B和靶T放置成彼此面对,在至少10mm的空间范围内的电势从衬底B横向延伸。基板B的外圆周被控制为等于基板B上的电势,和/或基板B被壁面10S包围,该壁表面10S的电位被控制为等于基板B上的电势。 (C)2010,日本特许厅&INPIT

著录项

  • 公开/公告号JP5399165B2

    专利类型

  • 公开/公告日2014-01-29

    原文格式PDF

  • 申请/专利权人 富士フイルム株式会社;

    申请/专利号JP20090185799

  • 发明设计人 藤井 隆満;直野 崇幸;新川 高見;

    申请日2009-08-10

  • 分类号C23C14/34;C23C14/08;H01L41/09;H01L41/187;H01L41/18;B41J2/055;B41J2/045;B41J2/16;

  • 国家 JP

  • 入库时间 2022-08-21 16:11:54

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