METHODS AND STRUCTURE FOR ON-CHIP CLOCK JITTER TESTING AND ANALYSIS

摘要

Methods and structure for on-chip self-test of clock jitter for an application clock signal generated within an integrated circuit (IC). Features and aspects hereof provide for acquisition of samples of an application clock signal within the IC and counting the number of samples having a predetermined value. The count is compared to acceptable limits range values to generate a pass/fail signal of the IC use by external automated. A sample clock is generated based on the reference clock used by a Phase Locked Loop (PLL) circuit. An incremental delay is added to the sample clock pulse such that the sequence of samples “walk” through an application clock pulse waveform to sense clock jitter at various points of the waveform based on the counts. Acceptable limits range for the count at each sampled point, the incremental delay, and the number of samples at each delayed value may be user programmed