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High speed digital transient waveform detection system and method for use in an intelligent electronic device

机译:用于智能电子设备的高速数字瞬态波形检测系统和方法

摘要

A system and a method is provided for the detection and capture, and in particular for an ultra high speed detection and capture, of transients in input voltages by an intelligent electronic device. The system and method detects transients for input voltages in either phase to phase or phase to neutral measurements and permits a user to set threshold levels for detecting transients in input voltages. In an embodiment, the system and method further provides a field programmable gate array as a controller for managing transient detection. The field programmable gate array includes a state machine for determining the state of the sampled signal with respect to a threshold level at a specified waveform sample period.
机译:提供了一种用于通过智能电子设备检测和捕获,特别是用于超高速检测和捕获输入电压中的瞬变的系统和方法。该系统和方法检测相间或相中性测量中输入电压的瞬变,并允许用户设置阈值电平以检测输入电压中的瞬变。在一个实施例中,该系统和方法还提供了现场可编程门阵列作为用于管理瞬态检测的控制器。现场可编程门阵列包括状态机,该状态机用于在指定的波形采样周期处相对于阈值水平确定采样信号的状态。

著录项

  • 公开/公告号US8666688B2

    专利类型

  • 公开/公告日2014-03-04

    原文格式PDF

  • 申请/专利权人 JOSEPH SPANIER;HAI ZHU;WEI WANG;

    申请/专利号US20080075747

  • 发明设计人 HAI ZHU;WEI WANG;JOSEPH SPANIER;

    申请日2008-03-13

  • 分类号G06F11/30;G01R1/40;G01R19/04;G06F19/00;G06F17/40;

  • 国家 US

  • 入库时间 2022-08-21 15:59:14

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