首页> 外国专利> Method for determination of supporting point-specific vertical total electron contents, involves determining specific vertical total electron content in dependence of inclined total electron content and point conversion function

Method for determination of supporting point-specific vertical total electron contents, involves determining specific vertical total electron content in dependence of inclined total electron content and point conversion function

机译:确定支持点特定的垂直总电子含量的方法,涉及根据倾斜的总电子含量和点转换函数确定特定的垂直总电子含量

摘要

The method involves determining support point specific vertical electron density distribution of incremental electron content based on initial supporting point-specific vertical total electron content (VTEC1-VTEC4). Inclined total electron content in dependence of increment electron contents is determined, so that specific support-point conversion function between inclined total electron content and vertical total electron content is determined. Specific vertical total electron content in dependence of inclined total electron content and function is determined. An independent claim is included for the device for determination of supporting point-specific vertical total electron contents.
机译:该方法包括基于初始支撑点特定的垂直总电子含量(VTEC1-VTEC4)确定增量电子含量的支撑点特定的垂直电子密度分布。确定倾斜的总电子含量取决于增量电子含量,从而确定倾斜的总电子含量与垂直总电子含量之间的特定支撑点转换函数。根据倾斜的总电子含量和功能确定比垂直总电子含量。用于确定支撑点特定的垂直总电子含量的装置包括独立权利要求。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号