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Manufacturing equipment and manufacturing equipment of EUVL mask blanks for EUVL reflective mask

机译:EUVL反射罩用EUVL罩坯的制造设备和制造设备

摘要

PROBLEM TO BE SOLVED: To provide an apparatus for manufacturing a mask (mask blank) for EUVL (extreme-ultraviolet lithography), which restrains an influence from being exerted by pressure fluctuations for a short time.;SOLUTION: An apparatus 20 for manufacturing a reflective mask (mask blank) for EUV lithography includes a fan filter unit 25 which introduces clean air, introduced into a working area 11 of a clean room 10, as ultraclean air into the apparatus 20, an opening 24 for carrying-out and carrying-in, and an opening 26 for exhaust. An opening 27 for a breathing mechanism is provided in a position on the downstream side with respect to the opening for carrying-out and carrying-in and on the upstream side with respect to the opening for exhaust, in the circulating direction of the ultraclean air in the apparatus 20. The apparatus 20 also includes the breathing mechanism which introduces the clean air into or discharges the clean air from the apparatus 20, depending on a fluctuation in pressure difference between pressure in the apparatus 20 and pressure in the working area 11 of the clean room 10.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种用于制造用于EUVL(极紫外光刻)的掩模(掩模坯料)的设备,该设备抑制在短时间内由压力波动施加的影响。解决方案:一种用于制造掩模的设备20。用于EUV光刻的反光罩(罩坯)包括一个风扇过滤器单元25,用于将超净空气引入清洁室10的工作区域11中,该超净空气作为清洁气体引入设备20中,该开口用于执行和执行以下操作:内有一个排气口26。在超净空气的循环方向上,在相对于搬出搬入用开口的下游侧和相对于排气用开口的上游侧的位置,设置有用于呼吸机构的开口27。设备20中还包括呼吸机构,该呼吸机构根据设备20中的压力与工作区域11中的压力之间的压力差的波动将清洁空气引入设备20中或从设备20中排出清洁空气。洁净室10 .;版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP5742619B2

    专利类型

  • 公开/公告日2015-07-01

    原文格式PDF

  • 申请/专利权人 旭硝子株式会社;

    申请/专利号JP20110202837

  • 发明设计人 梅尾 直弘;三森 喬宏;伊勢 博利;

    申请日2011-09-16

  • 分类号H01L21/027;G03F1/24;

  • 国家 JP

  • 入库时间 2022-08-21 15:29:16

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