首页> 外国专利> Wafer level chip on chip package, package on package improving solder joint reliability but reducing mounting height and manufacturing method thereof

Wafer level chip on chip package, package on package improving solder joint reliability but reducing mounting height and manufacturing method thereof

机译:晶圆级芯片级封装,提高封装的焊点可靠性但减小安装高度的封装及其制造方法

摘要

A method of manufacturing a multi-chip package in which a plurality of semiconductor chips are mounted on a single package using a chip-on-chip technique reduces warping due to a difference in coefficients of thermal expansion (CTEs) between a printed circuit board (PCB) and a stacked semiconductor chip. A package on package is manufactured by vertically stacking packages to operate a memory semiconductor chip package and a logic semiconductor chip package in a single system. To improve a non-wet defect of solder balls used to connect packages and minimize the mounting height of the package on package, a protection member formed of an epoxy mold compound (EMC) is formed on the memory semiconductor chip package to only partially expose the solder balls, and the exposed portions of the solder balls are connected to vias formed in a rear surface of the logic semiconductor chip package using a solder ball attaching process.
机译:一种制造多芯片封装的方法,其中使用芯片上芯片技术将多个半导体芯片安装在单个封装上,从而减少了由于印刷电路板之间的热膨胀系数(CTE)差异而引起的翘曲( PCB)和堆叠的半导体芯片。通过垂直堆叠封装来制造堆叠封装,以在单个系统中操作存储器半导体芯片封装和逻辑半导体芯片封装。为了改善用于连接封装的焊球的非湿缺陷并最小化封装在封装上的安装高度,在存储半导体芯片封装上形成由环氧模塑料(EMC)形成的保护构件以仅部分暴露封装。焊球,并且焊球的暴露部分使用焊球附接工艺连接到形成在逻辑半导体芯片封装的后表面中的通孔。

著录项

  • 公开/公告号KR101461630B1

    专利类型

  • 公开/公告日2014-11-20

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20080109802

  • 发明设计人 조윤래;

    申请日2008-11-06

  • 分类号H01L23/12;H01L23/48;H01L21/60;

  • 国家 KR

  • 入库时间 2022-08-21 15:01:16

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