首页> 外国专利> Substrate treating apparatus for etching the back-side surface of substrate and method of treating substrate with using this

Substrate treating apparatus for etching the back-side surface of substrate and method of treating substrate with using this

机译:用于蚀刻基板的背面的基板处理装置以及使用该基板处理装置的基板的处理方法

摘要

A semiconductor substrate processing apparatus capable of etching a bottom surface of a substrate and a semiconductor substrate processing method using the same, the semiconductor substrate processing apparatus comprising: a process chamber for providing a chemical reaction space; A susceptor body located in the reaction space and having a seating surface on which the semiconductor substrate is placed, the susceptor body having a gas ejection portion for ejecting an etching gas onto a lower surface of the semiconductor substrate; And a susceptor shaft for supporting the susceptor body and having a gas supply pipe for supplying an etching gas to the gas spraying portion. The semiconductor substrate processing apparatus according to claim 1, According to the present invention, an upper or lower surface of a semiconductor substrate is selectively etched by using an etching gas such as hydrochloric acid (HCl) gas or chlorine (Cl 2 ) gas in a semiconductor growth apparatus capable of inducing a nitrogen atmosphere The semiconductor device or the semiconductor substrate can be manufactured more efficiently by simultaneously etching the upper and lower surfaces of the semiconductor substrate.
机译:能够蚀刻基板的底面的半导体基板处理装置和使用该基板处理装置的半导体基板处理方法,该半导体基板处理装置包括:用于提供化学反应空间的处理室;和基座体,其位于反应空间内,并具有载置半导体基板的座面,该基座体具有用于将蚀刻气体喷出到半导体基板的下表面的气体喷出部。基座轴用于支撑基座主体并具有用于将蚀刻气体供应到气体喷射部的气体供应管。 2.根据权利要求1所述的半导体基板处理装置,其特征在于,在本发明中,使用盐酸(HCl)气体或氯气(Cl 2 <Cl 2)等蚀刻气体对半导体基板的上表面或下表面进行选择性蚀刻。能够诱发氮气氛的半导体生长装置中的气体可以通过同时蚀刻半导体基板的上下表面来更有效地制造半导体装置或半导体基板。

著录项

  • 公开/公告号KR101564962B1

    专利类型

  • 公开/公告日2015-11-03

    原文格式PDF

  • 申请/专利权人 주식회사 루미스탈;

    申请/专利号KR20140011302

  • 发明设计人 이현재;

    申请日2014-01-29

  • 分类号H01L21/3065;

  • 国家 KR

  • 入库时间 2022-08-21 14:57:31

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