首页> 外国专利> A charged particle beam generating device, a charged particle beam device, a high voltage generating device, and a high potential device

A charged particle beam generating device, a charged particle beam device, a high voltage generating device, and a high potential device

机译:带电粒子束产生装置,带电粒子束装置,高压产生装置和高电位装置

摘要

A charged particle beam-generating instrument according to the present invention is provided with: a charged particle source, a plurality of first-electrode-arranged charged particles along a charged-particle direction, a plurality of insulation elements disposed between the first electrodes, and a housing which is mounted around the plurality of first electrodes. The housing is made of an insulating solid material and has a plurality of second electrodes disposed at positions near the plurality of first electrodes. At least one of the plurality of second electrodes is electrically connected to at least one of the plurality of first electrodes, each of the plurality of second electrodes having the same potential as the nearby one of the first electrodes.
机译:本发明的带电粒子束发生装置具备:带电粒子源;沿着带电粒子方向排列有多个第一电极的带电粒子;在所述第一电极之间配置有多个绝缘元件;以及壳体安装在多个第一电极周围。壳体由绝缘固体材料制成,并且具有设置在多个第一电极附近的位置的多个第二电极。多个第二电极中的至少一个电连接至多个第一电极中的至少一个,多个第二电极中的每个具有与附近的第一电极相同的电位。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号