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Displacement detecting device, scale calibrating method and scale calibrating program

机译:位移检测装置,刻度校正方法及刻度校正程序

摘要

A displacement detecting device includes: a scale (10) which has an optical lattice; a detecting unit (20) which is disposed so as to be movable in a scanning direction relative to the scale, inclusive of at least a first detection portion (21), a second detection portion (22) and a third detection portion (23), arranged in the scanning direction for detecting position information from the optical lattice; and a calculating portion (30) configured to obtain a self-calibration curve on graduations of the scale by specifying positions of the detection portions and calculating measurement error based on the position information detected by the detecting unit, wherein: the detecting unit is provided so that a distance between the first detection portion (21) and the second detection portion (22) and a distance between the second detection portion (22) and the third detection portion (23) are different from each other and do not form an integral multiple.
机译:一种位移检测装置,包括:具有光学晶格的标尺(10);和检测单元(20),其设置成可相对于标尺在扫描方向上移动,至少包括第一检测部分(21),第二检测部分(22)和第三检测部分(23)布置在扫描方向上,用于检测来自晶格的位置信息;计算部分(30),其通过指定检测部分的位置并基于由检测单元检测到的位置信息来计算刻度上的刻度,从而获得自校准曲线,其中:第一检测部(21)与第二检测部(22)之间的距离以及第二检测部(22)与第三检测部(23)之间的距离互不相同,并且不形成整数倍。 。

著录项

  • 公开/公告号EP2587224B1

    专利类型

  • 公开/公告日2016-03-09

    原文格式PDF

  • 申请/专利权人 MITUTOYO CORP;

    申请/专利号EP20120188797

  • 发明设计人 KIMURA AKIHIDE;

    申请日2012-10-17

  • 分类号G01D5/244;

  • 国家 EP

  • 入库时间 2022-08-21 14:50:42

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