X-ray examination apparatus, a control method of the X-ray inspection apparatus, a program for controlling the X-ray examination apparatus, and a computer-readable recording medium storing the program

摘要

PROBLEM TO BE SOLVED: To provide an X-ray inspection device that prevents a reduction in inspection accuracy and inspection speed.SOLUTION: A processing for an X-ray inspection device to recognize an artifact includes: a step for obtaining a tomographic image S1 from a reconstructed image in an imaging condition 1 (S510); a step for obtaining a tomographic image S2 from a reconstructed image in an imaging condition 2 (S520); a step for calculating a difference between the tomographic images (S1-S2) (S530); and a step for determining the absolute value of the difference equal to or more than a threshold to be an artifact (S540).