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Laser plasma etching wafer dicing using a UV reactive adhesive film

机译:使用紫外线反应性胶膜的激光等离子体蚀刻晶圆切割

摘要

laser plasma etching wafer dicing using a UV reactive adhesive film is described. In one example, the method includes forming a mask over the semiconductor wafer. The semiconductor wafer is bonded to a carrier substrate by UV reactive adhesive film. Mask covers the integrated circuit, to protect. Mask is patterned by laser scribing process, whereby I to provide a mask which is patterned with gaps. Patterning exposes an area of the semiconductor wafer between integrated circuits. Thereafter, the semiconductor wafer is etched through the gaps in the mask that is patterned, thereby I to form an integrated circuit which has been singulated. Then, UV reactive adhesive film is irradiated with ultraviolet (UV) light. Then, singulated integrated circuit is removed from the carrier substrate.
机译:描述了使用UV反应性粘合剂膜的激光等离子体蚀刻晶片切割。在一示例中,该方法包括在半导体晶片上方形成掩模。半导体晶片通过UV反应性粘合膜粘合到载体基板。掩膜覆盖集成电路,以进行保护。通过激光刻划工艺对掩模进行构图,从而提供具有间隙构图的掩模。图案化暴露了集成电路之间的半导体晶片的区域。之后,通过图案化的掩模中的间隙蚀刻半导体晶片,从而形成已经被分割的集成电路。然后,用紫外线(UV)照射UV反应性粘合膜。然后,从载体基板去除单个集成电路。

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