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SEMICONDUCTOR GATE WITH WIDE TOP OR BOTTOM

机译:宽或底宽的半导体门

摘要

A semiconductor structure with wide-bottom and/or wide-top gates includes a semiconductor substrate, a source region(s), a drain region(s) associated with the source region(s), and a gate(s) associated with the source region(s) and the drain region(s) having a top portion and a bottom portion. One of the top portion and the bottom portion of the gate(s) is wider than the other of the top portion and bottom portion. The wide-bottom gate is created using a dummy wide-bottom gate etched from a layer of dummy gate material, creating spacers for the dummy gate, removing the dummy gate material and filling the opening created with conductive material. For the wide-top gate, first and second spacers are included, and instead of removing all the dummy gate material, only a portion is removed, exposing the first spacers. The exposed portion of the first spacers may either be completely or partially removed (e.g., tapered), in order to increase the area of the top portion of the gate to be filled.
机译:具有宽底和/或宽顶栅极的半导体结构包括半导体衬底,源极区,与源极区相关联的漏极区,以及与源极区相关联的栅极。源区和漏区具有顶部和底部。浇口的顶部和底部之一比顶部和底部中的另一个宽。使用从伪栅极材料层蚀刻的伪宽底栅极,形成伪栅极的间隔物,去除伪栅极材料并填充导电材料所形成的开口来形成宽底栅极。对于宽顶栅,包括第一和第二间隔物,代替去除所有的伪栅材料,仅去除一部分,露出第一间隔物。第一隔离物的暴露部分可以被完全或部分去除(例如,逐渐变细),以便增加要填充的栅极的顶部的面积。

著录项

  • 公开/公告号US2016049488A1

    专利类型

  • 公开/公告日2016-02-18

    原文格式PDF

  • 申请/专利权人 GLOBALFOUNDRIES INC.;

    申请/专利号US201414458941

  • 申请日2014-08-13

  • 分类号H01L29/423;H01L21/3213;H01L21/8234;H01L27/105;H01L27/088;H01L29/66;H01L27/11;

  • 国家 US

  • 入库时间 2022-08-21 14:36:30

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