A diffraction phase microscope system according to an embodiment of the present invention includes a light source irradiating unit for mixing and irradiating light of at least two laser light sources having different wavelengths; A holder for holding the sample and irradiating light of the light source irradiating unit; A common path part for diffracting and interfering with light passing through the sample of the cradle; An image pickup section for picking up optical information passed through the common path section as an image; And an operation control unit connected to the image sensing unit. The measurement method using the diffraction phase microscope system according to the embodiment of the present invention eliminates the phase wrapping problem due to the difference in incidence angle of the laser light and easily and accurately determines the thickness and the refractive index of the sample through one image It can be measured at the same time.
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