首页> 外国专利> Paint for measuring deformation of structure tape comprising the same and deformation measuring method of structure using the same

Paint for measuring deformation of structure tape comprising the same and deformation measuring method of structure using the same

机译:用于测量结构带的变形的涂料和包括该涂料的结构变形的测量方法

摘要

The invention structure deformation measuring paint, relates to a modified method of measuring tape and structures using the same comprising the same, more specifically, the structure deformation measuring coating material of the present invention is modified, and whether modified, depending on the deformation of the structure for by containing the magnetic optical crystal so that it can determine easily an be utilized to measure the deformation of the structure. ; According to the present invention, it is possible to easily measure the strain and the amount of deformation of the structure caused by like working load can be avoided, the occurrence of accidents due to excessive deformation of the structure. ; The magnetic photonic crystal cluster, color structure, magnetic flux, structure, deformation measurements
机译:本发明的结构形变测量涂料,涉及测量卷尺的改进方法和使用该方法的结构,更具体地,根据本发明的结构形变测量涂料的改性,以及是否改性。通过包含磁性光学晶体以便可以容易地确定其结构,可以用于测量结构的变形。 ;根据本发明,可以容易地测量应变,并且可以避免由相同的工作负荷引起的结构的变形量,并且由于结构的过度变形而导致事故的发生。 ;磁光子晶体团簇,颜色结构,磁通量,结构,形变测量

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