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STABILITY ENHANCEMENTS IN METAL OXIDE SEMICONDUCTOR THIN FILM TRANSISTORS
STABILITY ENHANCEMENTS IN METAL OXIDE SEMICONDUCTOR THIN FILM TRANSISTORS
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机译:金属氧化物半导体薄膜晶体管的稳定性增强
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摘要
The plasma hydrogenation region in the dielectric layer of the semiconductor thin film transistor (TFT) structure improves the stability of the TFT. The TFT is a multilayer structure including an electrode, a dielectric layer disposed on the electrode, and a metal oxide semiconductor on the dielectric. Exposure of the dielectric layer to the hydrogen-containing plasma prior to deposition of the semiconductor creates a plasma hydrogenation zone at the semiconductor-dielectric interface. The plasma hydrogenation region includes hydrogen whose concentration is reduced from the semiconductor / dielectric interface to the bulk of one or both of the dielectric layer and the semiconductor layer.;
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