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STABILITY ENHANCEMENTS IN METAL OXIDE SEMICONDUCTOR THIN FILM TRANSISTORS

机译:金属氧化物半导体薄膜晶体管的稳定性增强

摘要

The plasma hydrogenation region in the dielectric layer of the semiconductor thin film transistor (TFT) structure improves the stability of the TFT. The TFT is a multilayer structure including an electrode, a dielectric layer disposed on the electrode, and a metal oxide semiconductor on the dielectric. Exposure of the dielectric layer to the hydrogen-containing plasma prior to deposition of the semiconductor creates a plasma hydrogenation zone at the semiconductor-dielectric interface. The plasma hydrogenation region includes hydrogen whose concentration is reduced from the semiconductor / dielectric interface to the bulk of one or both of the dielectric layer and the semiconductor layer.;
机译:半导体薄膜晶体管(TFT)结构的介电层中的等离子体氢化区域改善了TFT的稳定性。 TFT是多层结构,其包括电极,设置在该电极上的电介质层以及该电介质上的金属氧化物半导体。在沉积半导体之前,将介电层暴露于含氢等离子体中会在半导体-介电界面处形成等离子体氢化区。等离子体氢化区域包括氢,其浓度从半导体/介电界面到介电层和半导体层之一或两者的体积减小。

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