首页> 外国专利> METHOD OF DYNAMIC TESTING OF STRUCTURES AND SYSTEMS ON MECHANICAL AND ELECTRONIC EFFECTS

METHOD OF DYNAMIC TESTING OF STRUCTURES AND SYSTEMS ON MECHANICAL AND ELECTRONIC EFFECTS

机译:对机械和电子作用的结构和系统进行动态测试的方法

摘要

FIELD: testing equipment.;SUBSTANCE: invention relates to the field of dynamic testing of structures and can be used in tests of mechanical structures and electronic systems on dynamic mechanical or electronic effects. The proposed method of dynamic testing of structures and systems is designed for detection during the tests of dangerous parameter deviations. In the proposed method using the prior shock vibration excitation the object is loaded and the test signal is obtained by the excitation processing, which power distribution and the phase structure of the spectrum is fully consistent with the characteristics of the test object. All the frequency components of the test signal provide the greatest possible response of the test object, as a result of the inphase mutual addition of all the frequency components of the response at the end of each test pulse.;EFFECT: obtaining a test signal coherent with the characteristics of the test object, and the possibility of detecting a dangerous unpredictable system response to the test signal.;2 dwg
机译:技术领域本发明涉及结构的动态测试领域,并且可以用于对机械结构和电子系统进行动态的机械或电子效应的测试。设计了所提出的结构和系统动态测试方法,用于在危险参数偏差测试期间进行检测。在使用先有冲击振动激励的方法中,加载物体并通过激励处理获得测试信号,其功率分布和频谱的相位结构与测试物体的特性完全一致。测试信号的所有频率分量在每个测试脉冲结束时同相地相互添加响应的所有频率分量,从而使测试信号具有最大可能的响应;效果:获得相干的测试信号具有测试对象的特性,并有可能检测到对测试信号的不可预测的危险系统响应; 2 dwg

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号