The invention relates to a device and a method for examining a specimen with, in particular with a scanning. The device comprises a probe microscope device, which a sample pickup portion for receiving a sample to be examined, a measuring probe and a displacement support, which is configured, for a probe microscopic examination of the sample the sample holder and the measuring probe to move relative to one another, and a condenser illumination as well as a of the condenser illumination downstream optical system, which is configured from the condenser illumination in a condenser light path condenser light generates discharged under at least partial maintaining of the condenser light parameters, with which the condenser light generates from the condenser illumination is emitted, in the region of the sample pickup portion for an optical microscopy of the sample to be examined imaging.
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