The present invention provides a film forming method and a film forming apparatus capable of forming a + c polarity epitaxial film by a sputtering method. One embodiment of the present invention includes the following steps in a film forming method for epitaxially growing a semiconductor film having a wurtzite structure by sputtering on an epitaxial growth substrate heated to a predetermined temperature with a heater. First, the substrate is placed on a substrate holding portion having a heater so that the substrate is placed a predetermined distance away from the heater. Next, an epitaxial film of a semiconductor film having a wurtzite structure is formed on the substrate while adjusting the impedance of the substrate holding portion.
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