A method and apparatus for wirelessly testing an electronic device. The method begins when the test instructions are retrieved from a data execution unit that is part of a test wrapper circuit. The test wrapper circuit then relays to at least one electronic component to be tested. The testing is then performed in accordance with the received test instructions, which may include built-in self-tests, functional tests, logic tests, and other tests based on the performance characteristics of the device being tested. The test responses are collected and sent back to the data execution unit. The test wrapper circuit provides the functional blocks to facilitate wireless testing of the electronic device. These functional blocks include an instruction retrieving unit, a data retrieving unit, a response buffer, and a data execution unit that facilitates communication.
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