Method of generating a curve to determine an optimal operation of a wafer

摘要

The fail bit count data, shmoo data, static noise margins and write margins corresponding to a wafer are measured. Using the above mentioned measurements, variables used to generate the curve are calculated. The variables used to generate the curve include the standard deviation of the fail bit count data, the static noise margins and the write margins. The curve is used to determine optimal operating condition of a fabrication process.