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PROCESS OF PREPARING LOW DIELECTRIC CONSTANT THIN FILM LAYER USED IN INTEGRATED CIRCUIT

机译:用于集成电路的低介电常数薄膜层的制备方法

摘要

Preparing a low dielectric constant thin film layer used in an integrated circuit includes: extracting gas out of a furnace; when the vacuum level within the furnace is less than 10−3 Pa, starting a 13.36 MHz radio frequency power supply and a matcher; sending the exhaust nitrogen gas, used to remove remaining gas out of the furnace by a third gas inlet pipe, into the furnace through a second pressure gas mixing tank and a second nozzle sequentially; uniformly mixing octamethyl cyclotetrasiloxane and cyclohexane, and introducing same into a pressure stainless steel tank, and, respectively by first and second gas inlet tubes, introducing bubbled nitrogen gas and inert gas into the furnace sequentially through a first pressure gas mixing tank, the pressure stainless steel tank and a first nozzle; after deposition, transferring the deposited thin film layer to the furnace's heating zone for annealing, obtaining a low dielectric constant thin film layer.
机译:制备用于集成电路的低介电常数薄膜层包括:从炉子中抽出气体;当炉内真空度小于10 −3 Pa时,启动13.36MHz的射频电源和匹配器;依次通过第二压力气体混合罐和第二喷嘴将用于去除残留气体的废气通过第三进气管从炉中送出至炉内。将八甲基环四硅氧烷和环己烷均匀混合,然后将其引入压力不锈钢罐中,并分别通过第一和第二进气管,通过第一压力气体混合罐将鼓入的氮气和惰性气体依次引入炉中,压力不锈钢钢罐和第一喷嘴;沉积后,将沉积的薄膜层转移到炉子的加热区进行退火,以获得低介电常数的薄膜层。

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