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State change detection for two-terminal memory during application of a state-changing stimulus

机译:应用状态更改刺激过程中的两个终端内存的状态更改检测

摘要

A detection circuit that can detect a two-terminal memory cell changing state. For example, in response to electrical stimuli, a memory cell will change state (e.g., to a highest resistance state), but existing techniques do not detect this state change until after the stimuli is completed and a subsequent sensing operation (e.g., read pulse) is performed. The detection circuit can detect the state change during application of the electrical stimuli that causes the state change.
机译:一种检测电路,可以检测到两端存储单元的变化状态。例如,响应于电刺激,存储单元将改变状态(例如,变为最高电阻状态),但是现有技术直到刺激完成并且随后的感测操作(例如,读取脉冲)之后才检测到该状态改变。 )。检测电路可以在施加电刺激的过程中检测引起状态变化的状态变化。

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