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State change detection for two-terminal memory during application of a state-changing stimulus
State change detection for two-terminal memory during application of a state-changing stimulus
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机译:应用状态更改刺激过程中的两个终端内存的状态更改检测
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摘要
A detection circuit that can detect a two-terminal memory cell changing state. For example, in response to electrical stimuli, a memory cell will change state (e.g., to a highest resistance state), but existing techniques do not detect this state change until after the stimuli is completed and a subsequent sensing operation (e.g., read pulse) is performed. The detection circuit can detect the state change during application of the electrical stimuli that causes the state change.
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