Identifying the cause of timing failure of an IC design using sequential timing

摘要

A method of optimizing timing performance of an IC design is provided. The IC design is expressed as a graph that includes a plurality of nodes representing IC components. The method identifies several paths in the graph that each starts from a timed source node and ends to a timed target node. Each path includes several clocked elements and several computational elements. The method optimizes the timing performance of the IC design by skewing clock signals to one or more clocked elements to satisfy a set of timing constraints. For each identified path, the method determines the ratio of signal travel time from the source node to the destination node to a maximum time allocated for the data signal to travel from the source node to the target node. When the IC design fails timing constraints, the path that has a maximum determined ratio as a cause for timing failure.