首页>
外国专利>
Circuitry and method for timing speculation via toggling functional critical paths
Circuitry and method for timing speculation via toggling functional critical paths
展开▼
机译:通过切换功能关键路径进行时序推测的电路和方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
Toggling functional critical path timing sensors measure delays in toggling functional critical paths that are replicas of actual critical paths or representations of worst-case delay paths. A Toggle flip-flop or Linear-Feedback-Shift Register (LFSR) drives high-transition-density test patterns to the toggling functional critical paths. When a toggling functional critical path's delay fails to meet set-up timing requirement to a next register, the toggling functional critical path timing sensors signal a controller to increase VDD. When no failures occur over a period of time, the controller decreases VDD. A margin delay buffer adds a delay to the toggling functional critical path before being clocked into an early capture flip-flop. A reference register receives the test pattern without the delay of the toggling functional critical path, and an exclusive-OR (XOR) gate compares outputs of reference and early capture flip-flops to generate timing failure signals to the controller.
展开▼