The present invention relates to a correlative light-electron microscope which has a light path disposed in the path of an electron beam, also has, disposed therein, yoke units provided with pole pieces, which are capable of controlling the generation position of a magnetic field, so as for a sample to be positioned in proximity to a magnetic lens part, thus does not lower the resolution of an electron microscope, and is capable of high-resolution microscopy. By using semi-in-lenses having various forms or disposing a light-reflecting mirror in the space between the pole pieces and thereby maintaining the distance between the magnetic lens and the sample, the present invention substantially does not increase the focal length of an electron microscope objective lens and thus has the effect of achieving high resolution for an electron microscope image.
展开▼
