首页> 外国专利> COMBINED SPECTRAL PROBE AND SPECTRAL ANALYSIS SYSTEM

COMBINED SPECTRAL PROBE AND SPECTRAL ANALYSIS SYSTEM

机译:光谱探针和光谱分析系统相结合

摘要

Disclosed are a combined spectral probe and a spectral analysis system. The combined spectral probe (10) comprises a spectral probe (11), a camera (12), and a broadband illumination source (13). The spectral probe (11) is used to emit excitation light and receive light (18) produced by interaction between the excitation light (17) and a object under detection (200). The camera (12) is used to photograph and record images of substances to be identified, analysis or experiment processes, users, and instruments or devices. The broadband illumination source (13) is used to provide illumination required by the camera (12) during photographing.
机译:公开了一种组合的光谱探针和光谱分析系统。组合光谱探测器(10)包括光谱探测器(11),照相机(12)和宽带照明源(13)。光谱探针(11)用于发射激发光并接收由激发光(17)和被检测物体(200)之间的相互作用产生的光(18)。摄像机(12)用于拍摄和记录要识别的物质,分析或实验过程,用户以及仪器或设备的图像。宽带照明源(13)用于提供照相机(12)在拍摄期间所需的照明。

著录项

  • 公开/公告号WO2017167181A1

    专利类型

  • 公开/公告日2017-10-05

    原文格式PDF

  • 申请/专利权人 GLIT TECHNOLOGIES (SHENZHEN) PTE LTD;

    申请/专利号WO2017CN78435

  • 发明设计人 YUAN GAOQIANG;

    申请日2017-03-28

  • 分类号G01N21/63;G01J3/28;

  • 国家 WO

  • 入库时间 2022-08-21 13:29:28

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