首页> 外国专利> ANALYSIS SYSTEM FOR OCCURRENCE AND GROWTH PROGRESSION OF CRACK

ANALYSIS SYSTEM FOR OCCURRENCE AND GROWTH PROGRESSION OF CRACK

机译:裂纹发生与发展的分析系统

摘要

Disclosed is a system to analyze generation and progress of a crack, comprising: an image information acquiring unit to acquire first image information acquired by photographing an analysis object to be analyzed with generation and progress of a crack, and second image information acquired by photographing the analysis object at the same position as a position where the first image information is acquired after a predetermined time has lapsed from a time point at which the first image information is acquired; a position information acquiring unit to measure a position of the image information acquiring unit of the time point at which the first image information is acquired to acquire position information including longitude and latitude; a database to store the first image information and position information; and a crack analysis unit to separately extract image files from the first and second image information stored in the database, and comparing the extracted image files to analyze generation and progress of the crack. According to the present invention, generation and progress of a crack of a building is able to precisely be analyzed through image comparison of the building.
机译:公开了一种用于分析裂纹的产生和进行的系统,包括:图像信息获取单元,用于获取通过拍摄待分析的分析对象随裂纹的产生和进行而获得的第一图像信息,以及通过对裂纹的产生和进行进行拍摄而获得的第二图像信息。在从获取第一图像信息的时间点经过预定时间之后与获取第一图像信息的位置相同的位置处的分析对象;位置信息获取单元,用于测量获取第一图像信息的时间点的图像信息获取单元的位置,以获取包括经度和纬度的位置信息;数据库,用于存储第一图像信息和位置信息;裂纹分析单元,用于从数据库中存储的第一图像信息和第二图像信息中分别提取图像文件,并对提取的图像文件进行比较,以分析裂纹的产生和发展。根据本发明,能够通过建筑物的图像比较来精确地分析建筑物的裂缝的产生和进行。

著录项

  • 公开/公告号KR101793262B1

    专利类型

  • 公开/公告日2017-11-02

    原文格式PDF

  • 申请/专利权人 CHO HEUN SEOK;

    申请/专利号KR20170114938

  • 发明设计人 CHO HEUN SEOK;

    申请日2017-09-08

  • 分类号G01N21/88;G01N21/01;G06T7;

  • 国家 KR

  • 入库时间 2022-08-21 13:24:35

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