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DIAGNOSTIC METHOD OF RIEMANNIAN CURVATURE OF NANOTHIN CRYSTALS LATTICE

机译:纳米晶晶格的Rimann曲线的诊断方法。

摘要

FIELD: nanotechnology.;SUBSTANCE: method of diagnosing the Riemann curvature of the nanothin crystal lattice includes obtaining electron microscopic image of nanothin crystal in the bright field, getting of micro electron-diffraction pattern from the crystal, micro diffractive study of nanothin crystal, analysis of rotational curvature of the nanothin crystal lattice . At the nanothin crystal electron microscopic image select the physical point M and a two-dimensional direction, for that, select the pair - nonlinear bending extinction contours and the corresponding to it reflex at the micro electron-diffraction pattern, feeling azimuthal broadening; perform diagnosing of nanothin crystal lattice Riemann geometry at a given point M, and this two-dimensional direction, specified by bivector (a, b) - a pair of non-collinear vectors, starting from a single point, which coincides with the center of the micro electron-diffraction pattern, received from nanothin crystal, located in the micro electron-diffraction pattern plane, where the vector b corresponds to the broaden reflex, by the joint analysis of a pair - nonlinear bending extinction contour, presented in the electron-microscopic image of the crystal in the dark field, and corresponding to it reflex at the micro electron-diffraction pattern of the crystal, for determining the continuity of the reflex azimuthal broadening and continuity of the corresponding to it bending contour, then carry out the diagnosing of the Riemann curvature of the nanothin crystal lattice, by means of determining the numerical value of Riemann curvature of the nanothin crystal lattice in the given point M and given two-dimensional direction, specified by bivector (a, b), according to definite formula.;EFFECT: to provide the possibility of reliable, accurate and express method of diagnostics of the nanothin crystal lattice Riemann curvature .;6 dwg, 4 tbl
机译:领域:纳米技术;诊断:纳米薄晶格的黎曼曲率的诊断方法包括:在明场中获得纳米薄晶的电子显微图像;从晶体中获得微电子衍射图;对纳米薄晶体进行微衍射研究;分析纳米薄晶格的旋转曲率的分布。在纳米薄晶体电子显微图像上,选择物理点M和二维方向,为此,选择成对的-非线性弯曲消光轮廓,并在微电子衍射图案上反射相应的消光轮廓,感觉方位角变宽;在给定的点M上执行纳米薄晶格Riemann几何的诊断,此二维方向由bivector(a,b)指定-一对非共线矢量,从单个点开始,与点的中心重合通过对一对非线性弯曲的消光轮廓进行联合分析,从纳米薄晶体接收的微电子衍射图样位于微电子衍射图样平面中,其中矢量b对应于加宽反射。晶体在暗场中的显微图像,并与之对应,在晶体的微电子衍射图上发生反射,从而确定反射方位角展宽的连续性和与之对应的弯曲轮廓的连续性,然后进行诊断通过确定给定点的纳米薄晶格的黎曼曲率的数值来确定M和给定的二维方向,由bivector(a,b)根据确定的公式指定;效果:为诊断纳米薄晶格黎曼曲率提供了可靠,准确且快速的诊断方法的可能性; 6 dwg, 4汤匙

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