首页> 外国专利> Method for separating and visualizing austenite phase, martensite phase and bainite-ferrite matrix in bainitic steel and bainite steel piece for texture observation

Method for separating and visualizing austenite phase, martensite phase and bainite-ferrite matrix in bainitic steel and bainite steel piece for texture observation

机译:贝氏体钢和贝氏体钢中奥氏体相,马氏体相和贝氏体-铁素体基体的分离和可视化方法

摘要

To provide a method for separating and visualizing an austenite phase, a martensite phase and a bainite-ferrite matrix in bainitic steel, capable of discriminating austenite phase and martensite phase in bainitic steel on a nanoscale.The method of the present invention comprises: a) electropolishing a surface of a bainitic steel piece in an electrolyte solution containing a corrosive acid and an organic solvent to form a native oxide layer on the surface of the bainitic steel piece B) after completion of said electropolishing, said bainitic steel pieces are subsequently immersed in said electrolyte solution to form, on the region covering the martensite phase and the austenite phase of said native oxide layer, 1 and a second corrosion product layer, c) subjecting the surface of said bainitic steel piece to a scanning electron microscopic observation with a backscattering electron detector to measure said first and second corrosion By obtaining the contrast between the product layer and the remaining surface, the austenite phase is the darkest region, the bainite-ferrite matrix is the brightest region, and the martensite phase is It includes a step of visualizing, as the brightness of the region between the c) step is performed the incident energy of the primary electrons as follows 3 keV.BACKGROUND OF THE INVENTION
机译:提供一种用于分离和可视化贝氏体钢中的奥氏体相,马氏体相和贝氏体-铁素体基体的方法,该方法能够在纳米尺度上区分贝氏体钢中的奥氏体相和马氏体相。本发明的方法包括:a)在完成所述电抛光之后,在包含腐蚀性酸和有机溶剂的电解液中对贝氏体钢的表面进行电抛光,以在贝氏体钢的表面上形成天然氧化物层B),随后将所述贝氏体钢片浸入其中。所述电解质溶液在覆盖所述天然氧化物层的马氏体相和奥氏体相的区域上形成1和第二腐蚀产物层,c)对所述贝氏体钢的表面进行反向散射的扫描电子显微镜观察电子检测器,通过获得产品层和涂层之间的对比度来测量所述第一腐蚀和第二腐蚀剩余的表面,奥氏体相是最暗的区域,贝氏体-铁素体基体是最亮的区域,马氏体相是。它包括一个可视化步骤,因为执行c)步之间的区域的亮度是入射能量3 keV以下的一次电子的数量。发明背景

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