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3D shape measurement apparatus, measurement data processing unit, measurement data processing method, and computer program

机译:3D形状测量装置,测量数据处理单元,测量数据处理方法和计算机程序

摘要

PROBLEM TO BE SOLVED: To provide a three-dimensional measurement device, a measurement data processing unit, a measurement data processing method, and a computer program which can display an analysis result of analysis processing in an easy-to-see manner using a plurality of measurement data and can easily perform a change of information relating to an analysis technique of the analysis processing.SOLUTION: The setting of information relating to a plurality of analysis techniques is received. A plurality of analysis processing is executed based on information relating to an analysis technique having received the setting for every stored measurement data. An analysis result analyzed based on information relating to the same analysis technique among a plurality of analysis data displayed in a first direction and the analysis result by information relating to the plurality of analysis techniques displayed in a second direction orthogonal to the first direction are displayed side by side. Information relating to the analysis result which is set in the measurement data is updated, and the analysis result analyzed based on information relating to the updated analysis technique is displayed.
机译:解决的问题:提供一种三维测量装置,测量数据处理单元,测量数据处理方法和计算机程序,其可以使用多个视图以易于观察的方式显示分析处理的分析结果。测量数据,并且可以轻松地执行与分析处理的分析技术有关的信息更改。解决方案:接收与多种分析技术有关的信息设置。基于与已经接收了针对每个存储的测量数据的设置的分析技术有关的信息,执行多个分析处理。在第一方向显示的多个分析数据中,基于与同一分析技术有关的信息进行分析的分析结果,在与第一方向正交的第二方向中显示与与多种分析技术有关的信息的分析结果并排。更新与在测量数据中设置的分析结果有关的信息,并且显示基于与更新的分析技术有关的信息而分析的分析结果。

著录项

  • 公开/公告号JP6280458B2

    专利类型

  • 公开/公告日2018-02-14

    原文格式PDF

  • 申请/专利权人 株式会社キーエンス;

    申请/专利号JP20140132438

  • 发明设计人 田淵 潤;

    申请日2014-06-27

  • 分类号G01B11/24;G01B21/20;

  • 国家 JP

  • 入库时间 2022-08-21 13:07:58

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