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ALD METHOD AND APPARATUS FOR FORMING ALD OXIDE LAYER

机译:形成ALD氧化物层的ALD方法和装置

摘要

The present invention relates to an apparatus to form an ALD oxide layer and a method thereof. According to the present invention, the apparatus comprises: a gas inlet unit which receives hydrogen and oxygen for a radical reaction and reaction gas including silicon precursors; a fuzzy gas inlet unit which receives fuzzy gas; a gas reaction chamber which reacts with the reaction gas supplied from the reaction gas inlet unit to generate a radical; an ALD oxide layer forming chamber which accommodates the gas reaction chamber inside to make the radical generated by the gas reaction chamber with the Si precursors and to form an ALD oxide layer; a susceptor placed in the ALD oxide layer forming chamber to mount a substrate on a top side, on which the ALD oxide layer will be formed; and a gas exhaust unit which uses the fuzzy gas supplied from the fuzzy gas inlet unit to discharge unreacted gas and gas remaining after the reaction. The present invention provides a method to form the ALD oxide layer and the apparatus thereof, which are able to improve thickness uniformity of an ALD layer.
机译:本发明涉及形成ALD氧化物层的设备及其方法。根据本发明,该设备包括:进气单元,其接收用于自由基反应的氢和氧以及包括硅前体的反应气体;接收模糊气体的模糊气体入口单元;气体反应室,其与从反应气体入口单元供应的反应气体反应以产生自由基。 ALD氧化物层形成室,其在内部容纳气体反应室,以使气体反应室产生的自由基与Si前驱体一起形成ALD氧化物层;基座放置在ALD氧化物层形成室中,以将基板安装在将要形成ALD氧化物层的顶面上。排气单元,其使用从模糊气体入口单元供给的模糊气体来排出未反应的气体和反应后残留的气体。本发明提供了一种形成ALD氧化物层的方法及其设备,其能够改善ALD层的厚度均匀性。

著录项

  • 公开/公告号KR101807567B1

    专利类型

  • 公开/公告日2017-12-11

    原文格式PDF

  • 申请/专利权人 KIM YONG WEON;LEE HYUN JOO;

    申请/专利号KR20160157958

  • 发明设计人 KIM YONG WEON;LEE HYUN JOO;

    申请日2016-11-25

  • 分类号C23C16/448;C23C16/40;C23C16/44;C23C16/455;C23C16/458;C23C16/52;H01L21/02;

  • 国家 KR

  • 入库时间 2022-08-21 12:41:30

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