where S – reflection or transmission coefficient of the controlled part, and , and – radiation power values at the stage of the statement of the controlled part in the first and second registration channels, P1 and P2 – radiation power values at the step without the controlled part in the first and second registration channels, Tet is the transmittance of the reference element.;EFFECT: technical result is to improve the measurements accuracy.;1 cl, 1 dwg"/> METHOD OF DETERMINING THE REFLECTION OR TRANSMISSION COEFFICIENTS OF OPTICAL PARTS
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METHOD OF DETERMINING THE REFLECTION OR TRANSMISSION COEFFICIENTS OF OPTICAL PARTS

机译:测定光学零件的反射或透射系数的方法

摘要

FIELD: measurement technology.;SUBSTANCE: invention relates to the field of photometry and relates to a method for measuring reflection coefficients or transmitting optical components. Method includes performing measurements of the radiation power with the setting of the controlled part in the measurement circuit and without setting it. Measurements are carried out in two recording channels. In the first channel, the radiation power P1, that enters the measurement circuit from the radiation source is provided. In the second channel, the radiation power P2 is measured taking into account the losses due to a two-pass passage of the controlled part or a reference element with an adjustable transmittance Tet. To determine the reflection coefficients or the transmission of optical components, the following relation is used: where S – reflection or transmission coefficient of the controlled part, and , and – radiation power values at the stage of the statement of the controlled part in the first and second registration channels, P1 and P2 – radiation power values at the step without the controlled part in the first and second registration channels, Tet is the transmittance of the reference element.;EFFECT: technical result is to improve the measurements accuracy.;1 cl, 1 dwg
机译:用于测量反射系数或透射光学组件的方法技术领域本发明涉及测光领域,并且涉及一种用于测量反射系数或透射光学组件的方法。该方法包括通过在测量电路中设置受控部分而不设置它来执行辐射功率的测量。在两个记录通道中进行测量。在第一通道中,提供了从辐射源进入测量电路的辐射功率P 1 。在第二个通道中,在测量辐射功率P 2 时要考虑到受控制部件或参考元件具有可调透射率T et 。要确定反射系数或光学组件的透射率,请使用以下关系:<图像文件=“ 00000042.JPG” he =“ 10” imgContent =“ undefined” imgFormat =“ JPEG” wi =“ 23” />其中S –受控部分的反射或透射系数,<图像文件=“ 00000043.JPG” he =“ 10” imgContent =“ undefined” imgFormat =“ JPEG” wi =“ 15” />和<图像文件=“ 00000044。 JPG“ he =” 9“ imgContent =” undefined“ imgFormat =” JPEG“ wi =” 12“ />,<图像文件=” 00000045.JPG“ he =” 6“ imgContent =” undefined“ imgFormat =” JPEG“ wi =“ 5” />和<图像文件=“ 00000046.JPG” he =“ 6” imgContent =“ undefined” imgFormat =“ JPEG” wi =“ 6” /> –声明阶段的辐射功率值第一和第二注册通道的受控部分P 1 和P 2 –在第一和第二注册通道中没有受控部分的步骤的辐射功率值T < Sub> et 是参考元素的透射率。效果:技术成果是改进措施精度:1 cl,1 dwg

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