Arrangement and method for angle-resolved scattered-light measurement by means of a waveguide probe

摘要

The present invention relates to an arrangement and a method for angle-resolved scattered light measurement. The central element is a measuring substrate made of an optically transparent material, which has a continuous recess for forming a measuring volume. A plurality of optical waveguides emanating from the recess are integrated into the substrate, which extend between the recess and input or output surfaces on the measuring substrate and are aligned at the recess to a common measuring location in the measuring volume. The optical waveguides are generated by local change of the refractive index of the optically transparent material of the measuring substrate by means of short-time laser pulses in the measuring substrate. Due to this configuration of the waveguide, a high angular resolution is made possible with simultaneously high miniaturization of the measuring substrate. This makes it possible to perform inline measurements with high angular resolution even in highly concentrated samples.