DEVICE AND METHOD FOR ACCEPTING ANY ANALYSIS OF IMMEDIATE TELESCOPIC COVERAGE

摘要

An abnormality occurrence assuming apparatus which assumes occurrence of abnormality in a telescopic cover mounted on a machine tool performs supervised learning on the basis of a feature quantity extracted from a physical quantity detected during operation of the machine tool and information related to an abnormality that occurs in the telescope cover, and stores the result of learning. The abnormality occurrence-taking apparatus takes an abnormality that may occur in the telescopic cover during the operation of the machine tool on the basis of the result of the learning and the feature quantity extracted from the physical quantity.