首页> 外国专利> Three dimensional display device for high order brain function test, three-dimensional display method for high order brain function examination, and three-dimensional display program for higher brain function test

Three dimensional display device for high order brain function test, three-dimensional display method for high order brain function examination, and three-dimensional display program for higher brain function test

机译:用于高阶脑功能测试的三维显示设备,用于高阶脑功能检查的三维显示方法以及用于高阶脑功能测试的三维显示程序

摘要

To provide a three-dimensional display device, a three-dimensional display method and a three-dimensional display program for high order brain function inspection capable of properly inspecting a space recognition ability.SOLUTION: A three-dimensional display device 100 for high order brain function inspection comprises: a recording part 200 for recording a subject history 210, a TMT history and/or BIT history 230 and high order brain function inspection program information; a three-dimensional display part 300; and a control part 500 for controlling display of the three-dimensional display part 300. The control part 500 selects the high order brain function inspection program information based on at least the subject history 210 of the subject, any or both of the TMT history and/or BIT history 230 recorded in the recording part 200, and displays the high order brain function inspection on the three-dimensional display part 300.SELECTED DRAWING: Figure 1
机译:为了提供能够适当地检查空间识别能力的用于高阶脑功能检查的三维显示装置,三维显示方法和三维显示程序。解决方案:一种用于高阶大脑的三维显示装置100功能检查包括:记录部分200,用于记录对象历史210,TMT历史和/或BIT历史230以及高阶脑功能检查程序信息;三维显示部分300;以及控制部500,其用于控制​​三维显示部300的显示。控制部500至少基于被检体的被检体历史210,TMT历史和/或TMT历史和/或两者中的任意一个来选择高阶脑功能检查程序信息。 /或BIT历史记录230记录在记录部分200中,并在三维显示部分300上显示高阶脑功能检查。

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