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Dressing apparatus and dressing method of polishing pad of double-side polishing apparatus

机译:双面抛光装置的抛光垫的修整装置和修整方法

摘要

To provide a dressing apparatus capable of uniformly dressing a polishing pad. The apparatus includes first and second dressing grind stones 51 and 52 which grind polishing pads 17 and 18 by moving in a radial direction of upper and lower polishing plates 12 and 14 while abutting on corresponding polishing pads 17 and 18, in which the first and second dressing grind stones 51 and 52 are set so as to have: an inner side region portion P; an outer side region portion Q; and an intermediate region portion R, wherein the length of each of the inner side region portion P and the outer side region portion Q extending in a circumferential direction of the polishing plates 12 and 14 is longer than the length of the intermediate region portion R extending in a circumferential direction of the polishing plates.
机译:提供一种能够均匀地修整抛光垫的修整装置。该设备包括第一和第二修整磨石 51 52 ,它们通过移入来研磨抛光垫 17 18 。上下抛光板 12 14 的径向,同时紧靠相应的抛光垫 17 18,第一和第二修整磨石 51 52 被设置为具有:内侧区域部分P;和外侧区域部分Q;内侧区域部分P和外侧区域部分Q各自的长度在研磨板 12 14 的圆周方向上延伸。 B>比在研磨板的周向上延伸的中间区域R的长度长。

著录项

  • 公开/公告号US10286521B2

    专利类型

  • 公开/公告日2019-05-14

    原文格式PDF

  • 申请/专利权人 FUJIKOSHI MACHINERY CORP.;

    申请/专利号US201615200156

  • 发明设计人 MITSUHIRO HARA;RYOSUKE YODA;

    申请日2016-07-01

  • 分类号B24B53/017;

  • 国家 US

  • 入库时间 2022-08-21 12:16:06

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