首页> 外国专利> Measurement error correction method based on temperature-dependent displacement in measurement device and mass spectrometer using the same method

Measurement error correction method based on temperature-dependent displacement in measurement device and mass spectrometer using the same method

机译:基于测量装置中与温度有关的位移的测量误差校正方法以及使用该方法的质谱仪

摘要

A columnar rod reference member made of a material whose coefficient of thermal expansion is different from a flight tube is placed in contact with the tube. One end of the tube and o the reference member are fixed to each other with a fixture part. A distance measurement sensor measures the difference in length between the tube and the reference member whose lengths fluctuate due to a change in temperature. A displacement of the difference in length, as expressed by a proportion, is larger than that of the length of the flight tube. The difference in length is far smaller than the length of the flight tube. This improves detection of the displacement due to thermal expansion with a strain gauge or sensor. The m/z values in mass spectrum data are corrected based on the measured values of the displacement, whereby a highly accurate mass discrepancy correction is achieved.
机译:将由热膨胀系数不同于飞行管的材料制成的柱状杆基准构件与该管接触。管的一端和基准构件通过固定部彼此固定。测距传感器测量管和基准构件之间的长度差,该基准构件的长度由于温度变化而波动。长度差异的位移(以比例表示)大于飞管长度的位移。长度差远小于飞行管的长度。这改善了通过应变仪或传感器进行的热膨胀引起的位移检测。基于位移的测量值校正质谱数据中的m / z值,从而实现高精度的质量差异校正。

著录项

  • 公开/公告号US10438781B2

    专利类型

  • 公开/公告日2019-10-08

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORPORATION;

    申请/专利号US201515768174

  • 发明设计人 SHINICHI YAMAGUCHI;

    申请日2015-10-16

  • 分类号H01J49;G01N27/62;H01J49/40;

  • 国家 US

  • 入库时间 2022-08-21 12:14:44

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