Multi-view backscatter inspection system and multi-view backscatter inspection method

摘要

#$%^&*AU2018200809B220190221.pdf#####Abstract The present application discloses a multi-view backscatter inspection system and an inspection method. The inspection system comprises an inspection passage, at least two inspection units, a control device and a data processing device. The inspection unit comprises a radiation source and a detector array. The detector array comprises at least two detector modules arranged at different positions and independent of each other. At least two inspection units are arranged so that a radiation beam from any inspection unit is directed to the outside of the detector array of each of the remaining inspection units. The control device adjusts a phase difference between radiation beams of various radiation sources, so that an effective detection area of each of the detector arrays is far away from an interference area. When an inspection image corresponding to certain detector array at certain moment is formed, the data processing device calculates an effective detection area of the detector array at the moment, processes a detection signal from a detector module within the effective detection area and forms an inspection image in which the inspection target is located at one side of the detector array at the moment. The present application may improve the quality of an inspection image. 17I P I 8it UN*IN ~ K rK~N30 5 230 22 10 2 Fig. 3