首页> 外国专利> 3 3 3 3 THREE-DIMENSIONAL SURFACE ROUGHNESS EVALUATING DEVICE THREE-DIMENSIONAL SURFACE ROUGHNESS EVALUATING METHOD THREE-DIMENSIONAL SURFACE ROUGHNESS DATA ACQUIRING DEVICE AND THREE-DIMENSIONAL SURFACE ROUGHNESS DATA ACQUIRING METHOD

3 3 3 3 THREE-DIMENSIONAL SURFACE ROUGHNESS EVALUATING DEVICE THREE-DIMENSIONAL SURFACE ROUGHNESS EVALUATING METHOD THREE-DIMENSIONAL SURFACE ROUGHNESS DATA ACQUIRING DEVICE AND THREE-DIMENSIONAL SURFACE ROUGHNESS DATA ACQUIRING METHOD

机译:3 3 3 3三维表面粗糙度评估设备三维表面粗糙度评估方法三维表面粗糙度数据获取装置和三维表面粗糙度数据获取方法

摘要

The present invention relates to a two-dimensional laser displacement gauge, a movement mechanism for moving a two-dimensional laser displacement gauge in the X-axis direction, a movement distance measurement device for measuring a movement distance of the two-dimensional laser displacement gauge in the X- A three-dimensional surface roughness evaluating apparatus comprising: an arithmetic unit for generating three-dimensional surface roughness data to be measured on the basis of displacement data and movement distance data acquired by the movement distance measuring apparatus, wherein the two- Dimensional laser displacement gauge so that the width direction of the two-dimensional laser displacement gauge coincides with the Y-axis direction so that the displacement data of the two-dimensional laser displacement gauge can be measured every two times And the arithmetic unit averages the displacement data acquired at regular intervals in the X-axis direction by the two-dimensional laser displacement gauge in the Y-axis direction, Dimensional surface roughness data of the object to be measured by generating the reference surface data of the coordinates and subtracting the reference surface data of each coordinate from the displacement data of each X-Y plane coordinate.
机译:二维激光位移计,用于使二维激光位移计在X轴方向上移动的移动机构,用于测量二维激光位移计的移动距离的移动距离测量装置技术领域在X型三维表面粗糙度评估设备中,包括:运算单元,用于基于由移动距离测量设备获取的位移数据和移动距离数据来生成要测量的三维表面粗糙度数据,其中,使用二维激光位移计,使二维激光位移计的宽度方向与Y轴方向一致,从而可以每两次测量二维激光位移计的位移数据,并且算术单元平均位移二维激光d在X轴方向上等间隔地获取的数据在Y轴方向上的位移计上,通过生成坐标的参考表面数据并从每个X-Y平面坐标的位移数据中减去每个坐标的参考表面数据,来测量被测物体的尺寸表面粗糙度数据。

著录项

  • 公开/公告号KR20190028527A

    专利类型

  • 公开/公告日2019-03-18

    原文格式PDF

  • 申请/专利权人 주고꾸 도료 가부시키가이샤;

    申请/专利号KR20197004507

  • 发明设计人 미에노 히로히사;

    申请日2017-07-24

  • 分类号G01B11/30;G01B11;G01B11/02;G01D1/02;G01D5/347;G01J1/02;

  • 国家 KR

  • 入库时间 2022-08-21 11:51:24

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