首页> 外国专利> METHOD FOR EVALUATING STRUCTURE USED FOR NUCLIDE TRANSMUTATION REACTION, EVALUATING DEVICE, STRUCTURE MANUFACTURING DEVICE PROVIDED WITH SAME, AND NUCLIDE TRANSMUTATION SYSTEM

METHOD FOR EVALUATING STRUCTURE USED FOR NUCLIDE TRANSMUTATION REACTION, EVALUATING DEVICE, STRUCTURE MANUFACTURING DEVICE PROVIDED WITH SAME, AND NUCLIDE TRANSMUTATION SYSTEM

机译:评估用于核糖核酸转移反应的结构的方法,评估装置,具有该装置的结构制造装置以及核素转移系统

摘要

The object of the present invention is to provide an evaluation method and an evaluation device for nondestructively evaluating the soundness of a structure to be used for nuclide transmutation. The present invention relates to a method for evaluating a structure, the structure (1) including a base material (2) containing at least one kind of metal selected from the group consisting of hydrogen storage metals and hydrogen storage alloys, an intermediate layer (3) provided on the base material (2) and stacked alternately with a first layer containing low work function substances relatively lower in work function than the metal and a second layer containing the metal, and a surface layer (4) provided on the intermediate layer (3) and containing the metal, wherein the method includes measuring a change in polarization between incident light and reflected light by irradiating the surface layer (4) with light, while holding the structure (1) at a predetermined temperature, and comparing a measurement value of the change in polarization with a threshold of a change in polarization of a structure prepared in advance and evaluating a soundness of the structure (1) based on comparison results.
机译:发明内容本发明的目的是提供一种评估方法和评估装置,用于非破坏性地评估待用于核素lide变的结构的健全性。评估结构的方法技术领域本发明涉及一种评估结构的方法,该结构(1)包括含有至少一种选自储氢金属和储氢合金的金属的基础材料(2),中间层(3) )设置在基材(2)上,并交替层叠具有功函数比金属低的低功函数物质的第一层和包含金属的第二层,以及设置在中间层(2)上的表面层(4)。 3)并包含金属,其中该方法包括通过用光照射表面层(4),同时将结构(1)保持在预定温度下,测量入射光和反射光之间的偏振变化,并比较测量值极化的变化与预先准备的结构的极化的变化的阈值的比较,并基于比较来评估结构(1)的健全性结果。

著录项

  • 公开/公告号EP3584802A4

    专利类型

  • 公开/公告日2020-04-01

    原文格式PDF

  • 申请/专利权人 MITSUBISHI HEAVY INDUSTRIES LTD.;

    申请/专利号EP20180780695

  • 发明设计人 TSURUGA SHIGENORI;

    申请日2018-04-03

  • 分类号G21G7;G01N21/01;G01N21/21;G21G1/10;

  • 国家 EP

  • 入库时间 2022-08-21 11:40:43

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