首页> 外国专利> Warp determination device for corrugated board sheet manufacturing device, warp straightening device for corrugated cardboard sheet manufacturing device, and corrugated cardboard sheet manufacturing system

Warp determination device for corrugated board sheet manufacturing device, warp straightening device for corrugated cardboard sheet manufacturing device, and corrugated cardboard sheet manufacturing system

机译:瓦楞纸板制造装置的翘曲确定装置,瓦楞纸板制造装置的翘曲矫正装置和瓦楞纸板制造系统

摘要

The present invention makes it possible to determine a warp of a corrugated cardboard sheet in a state in which the corrugated cardboard sheet is nearly finished and at an early stage, and to correct the warp precisely and at an early stage on the basis of the warp determination. A warp determination device for a corrugated cardboard sheet manufacturing device is provided with: displacement value measurement method for measuring displacement values of a plurality of corrugated cardboard sheet pieces (24Ca, 24Cb, 24Cc) on the downstream side of a slitter scorer and on the upstream side of a sheet stacking unit; and warp status determination means for dividing a measurement range of the displacement value measurement method according to a width dimension W1 of the plurality of corrugated cardboard sheet pieces (24Ca, 24Cb, 24Cc), allocating the divided measurement ranges to each of the plurality of corrugated cardboard sheet pieces (24Ca, 24Cb, 24Cc), and determining a warped status of the corrugated cardboard sheet pieces (24Ca, 24Cb, 24Cc) for each of the plurality of corrugated cardboard sheet pieces (24Ca, 24Cb, 24Cc) on the basis of measurement values from the displacement value measurement method in the allocated measurement ranges.
机译:本发明使得可以在瓦楞纸板几乎完成并处于早期的状态下确定瓦楞纸板的翘曲,并且可以基于该翘曲精确地并且在早期校正翘曲。决心。用于瓦楞纸板片材制造装置的翘曲确定装置包括:位移值测量方法,用于测量纵切分切器的下游侧和上游的多个瓦楞纸板片材片(24Ca,24Cb,24Cc)的位移值。纸张堆叠单元的侧面;翘曲状态判定单元,其根据所述多个瓦楞纸板片材(24Ca,24Cb,24Cc)的宽度尺寸W1划分所述位移值测定方法的测定范围,对所述多个瓦楞纸板分别分配分割后的测定范围纸板片材(24Ca,24Cb,24Cc),并且基于多个纸板片材(24Ca,24Cb,24Cc)中的每个来确定纸板片材(24Ca,24Cb,24Cc)的翘曲状态。在分配的测量范围内根据位移值测量方法获得的测量值。

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