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Physical property value measuring apparatus, physical property value measuring method and program

机译:物性值测定装置,物性值测定方法及程序

摘要

The physical property measuring device (1) irradiates the sample (10) with heating light obtained by intensity-pulse-modulating the output light of the heating laser (12), and the output light of the temperature measuring laser (13) is used as the heating light. The sample (10) is irradiated with temperature measuring light delayed with respect to the sample. A component synchronized with the frequency of intensity pulse modulation in the detection signal of reflected light of the temperature measuring light is amplified by the lock-in amplifier (17), and the obtained thermoreflectance signal is subjected to regression analysis by the computer (18). In regression analysis, using the theoretical formula of the transfer function, which is the Laplace transform for the time of the response function by single pulse heating, with respect to the Fourier coefficient when the detection signal of the reflected light of the temperature measuring light is Fourier series expanded with respect to time. The thermophysical property value is obtained by regression analysis.
机译:物性测定装置(1)对试样(10)照射通过对加热激光器(12)的输出光进行强度脉冲调制而得到的加热光,将温度测量激光器(13)的输出用作光源。加热灯。用相对于样品延迟的温度测量光照射样品(10)。通过锁相放大器(17)放大与温度测量光的反射光的检测信号中的与强度脉冲调制的频率同步的成分,并通过计算机(18)对得到的热反射率信号进行回归分析。 。在回归分析中,使用测温函数的反射光的检测信号为傅里叶系数时的傅里叶系数,使用传递函数的理论公式,即通过单脉冲加热对响应函数的时间进行拉普拉斯变换。傅里叶级数在时间上有所扩展。通过回归分析获得热物理性质值。

著录项

  • 公开/公告号JPWO2019092898A1

    专利类型

  • 公开/公告日2019-11-21

    原文格式PDF

  • 申请/专利权人 株式会社ピコサーム;

    申请/专利号JP20180516599

  • 发明设计人 馬場 貴弘;馬場 哲也;

    申请日2018-03-27

  • 分类号G01N25/18;

  • 国家 JP

  • 入库时间 2022-08-21 11:34:18

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