首页> 外国专利> LOCAL FEATURE QUANTITY CALCULATION CIRCUIT AND LOCAL FEATURE QUANTITY CALCULATION METHOD

LOCAL FEATURE QUANTITY CALCULATION CIRCUIT AND LOCAL FEATURE QUANTITY CALCULATION METHOD

机译:局部特征量计算电路和局部特征量计算方法

摘要

To provide a local feature quantity calculation circuit configured to reduce circuit scale, power consumption, cost, and computation time, and a local feature quantity calculation method.SOLUTION: A local feature quantity calculation circuit includes: a block unit feature quantity calculation circuit which calculates local feature quantity of a block image; a buffer which holds local feature quantities of multiple block images; a temporary read register which sequentially holds local feature quantities of vertical n block images out of t block images comprising lateral m and vertical n block images to be used in interpolation, which are read from the buffer sequentially; a block register which sequentially shifts local feature quantities of the vertical n block images, which are output simultaneously from the temporary read register, to m register groups to be held; and an interpolation circuit which calculates local feature quantity of pixels of an image by interpolating local feature quantities of t block images which are output simultaneously from the block register.SELECTED DRAWING: Figure 1
机译:为了提供一种局部特征量计算电路和局部特征量计算方法,该局部特征量计算电路被配置为减少电路规模,功耗,成本和计算时间。解决方案:局部特征量计算电路包括:块单元特征量计算电路,其计算块图像的局部特征量;缓冲器,其保存多个块图像的局部特征量;临时读取寄存器,其顺序地保持垂直n块图像的局部特征量在包括要在插值中使用的横向m块图像和垂直n块图像的t个块图像中的n个块图像中,所述局部特征量从缓冲器被顺序地读取;块寄存器,其将从临时读取寄存器同时输出的垂直的n个块图像的局部特征量依次移位到要保持的m个寄存器组中;插值电路通过对从块寄存器同时输出的t个块图像的局部特征量进行插值来计算图像像素的局部特征量。

著录项

  • 公开/公告号JP2020004002A

    专利类型

  • 公开/公告日2020-01-09

    原文格式PDF

  • 申请/专利权人 MEGA CHIPS CORP;

    申请/专利号JP20180121868

  • 发明设计人 WATANABE SACHINORI;

    申请日2018-06-27

  • 分类号G06T1/20;

  • 国家 JP

  • 入库时间 2022-08-21 11:32:06

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