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Tap Dual Port Router, First, Second Multiplexer, First, Second Gating
Tap Dual Port Router, First, Second Multiplexer, First, Second Gating
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机译:分接双端口路由器,第一,第二多路复用器,第一,第二选通
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摘要
This disclosure describes a test architecture that supports a common approach to testing individual die and dies in a 3D stack arrangement. The test architecture uses an improved TAP design to facilitate the testing of parallel test circuits within the die.
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