;in which the trap rich layer comprises at least one first region and at least one second region adjacent to each other in the plane of the trap rich layer, the material of the at least one first region being in an at least partially recrystallized state and having an electrical resistivity less than that of the material in the at least one second region."/>
公开/公告号US10586810B2
专利类型
公开/公告日2020-03-10
原文格式PDF
申请/专利号US201816003199
申请日2018-06-08
分类号H01L29;H01L27/12;H01L29/06;H01L21/84;H01L21/324;H01L21/268;H01L21/763;H01L21/762;H01L21/02;
国家 US
入库时间 2022-08-21 11:25:24