首页> 外国专利> METHOD FOR EVALUATING STRUCTURE USED FOR NUCLIDE TRANSMUTATION REACTION, EVALUATION DEVICE, STRUCTURE MANUFACTURING DEVICE PROVIDED WITH SAME, AND NUCLIDE TRANSMUTATION SYSTEM

METHOD FOR EVALUATING STRUCTURE USED FOR NUCLIDE TRANSMUTATION REACTION, EVALUATION DEVICE, STRUCTURE MANUFACTURING DEVICE PROVIDED WITH SAME, AND NUCLIDE TRANSMUTATION SYSTEM

机译:评价用于核传递反应的结构的方法,评估装置,具有该核提供的结构制造装置和核传递系统

摘要

A method for evaluating a structure is disclosed, the structure including a base material containing at least one kind of metal selected from the group consisting of hydrogen storage metals and hydrogen storage alloys, an intermediate layer provided on the base material and stacked alternately with a first layer containing low work function substances relatively lower in work function than the metal and a second layer containing the metal, and a surface layer provided on the intermediate layer and containing the metal, wherein the method includes measuring a change in polarization between incident light and reflected light by irradiating the surface layer with light, while holding the structure at a predetermined temperature, and comparing a measurement value of the change in polarization with a threshold of a change in polarization of a structure prepared in advance and evaluating a soundness of the structure based on comparison results.
机译:公开了一种用于评估结构的方法,该结构包括:包含至少一种选自储氢金属和储氢合金的金属的基础材料;设置在该基础材料上并与第一材料交替堆叠的中间层。包含功函数比金属低的低功能层的层和包含金属的第二层以及设置在中间层上并包含金属的表面层,其中该方法包括测量入射光与反射光之间的偏振变化通过在保持结构处于预定温度的同时用光照射表面层,并且将偏振变化的测量值与预先准备的结构的偏振变化的阈值进行比较,并基于该结构来评估结构的健全性。比较结果。

著录项

  • 公开/公告号US2020088629A1

    专利类型

  • 公开/公告日2020-03-19

    原文格式PDF

  • 申请/专利权人 MITSUBISHI HEAVY INDUSTRIES LTD.;

    申请/专利号US201816495264

  • 发明设计人 SHIGENORI TSURUGA;

    申请日2018-04-03

  • 分类号G01N21/21;G01N21/55;G21G1/04;

  • 国家 US

  • 入库时间 2022-08-21 11:23:36

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