SCANNING PROBE OF ATOMIC-FORCE MICROSCOPE WITH DETACHABLE REMOTE-CONTROLLED NANOCOMPOSITE RADIATING ELEMENT DOPED WITH UPCONVERTING AND MAGNETIC NANOPARTICLES OF CORE-SHELL STRUCTURE

摘要

FIELD: measuring equipment.;SUBSTANCE: invention relates to a measuring technique and can be used in atomic force microscopy for diagnosing nanoscale structures. Magnetically transparent cantilever is connected to an electrically conductive magnetically transparent probing needle, the vertex of which is movably connected by means of two embedded nanotubes with a magnetically transparent detachable and autonomous functioning glass sphere with through nanosized pores, filled with upconverting nanoparticles and magnetic nanoparticles of core-shell structure, constantly located in control electromagnetic fields. Remote control of excitation of upconverting nanoparticles of nucleus-shell structure and their independent movement along coordinate Z at scanning side walls of nanowalls is carried out using two oppositely directed external excitation sources of upconverting nanoparticles and two controlled external counter-directed synchronized electromagnetic fields operating at selected wavelengths in the range of near infrared radiation.;EFFECT: technical result is possibility of nanowalls scanning along coordinate Z electromagnetic, with different optical wavelengths by exposing the walls of nanowalls with simultaneous measurement of electrical characteristics to this stimulating effect at one point of the surface of the diagnosed object with coordinates X, Y, without affecting adjacent sections.;1 cl, 3 dwg