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Plasma-assisted chemical vapor deposition of titanium oxide films by dielectric barrier discharge in TiCl4/O2/N2 gas mixtures

机译:在TiCl4 / O2 / N2混合气体中通过介电势垒放电等离子辅助化学气相沉积钛氧化物薄膜

摘要

Low-pressure dielectric barrier discharge (DBD) TiCl4/O2 and N2 plasmas have been used to deposit titanium oxide films at different power supply driving frequencies. A homemade large area low pressure DBD reactor was applied, characterized by the simplicity of the experimental set-up and a low consumption of feed gas and electric power, as well as being easy to operate. Atomic force microscopy, scanning electron microscopy, energy dispersive spectroscopy, and contact angle measurements have been used to characterize the deposited films. Experimental results show all deposited films are uniform and hydrophilic with a contact angle of about 15°. Compared to titanium oxide films deposited in TiCl4/O2 gas mixtures, those in TiCl4/O2/N2 gas mixtures are much more stable. The contact angle of titanium oxide films in TiCl4/O2/N2 gas mixtures with the addition of 50% N2 and 20% TiCl4 is still smaller than 20°, while that of undoped titanium oxide films is larger than 64° when they are measured after one week. The low-pressure TiCl4/O2 plasmas consist of pulsed glow-like discharges with peak widths of several microseconds, which leads to the uniform deposition of titanium oxide films. Increasing a film thickness over several hundreds of nm leads to the film's fragmentation due to the over-high film stress. Optical emission spectra (OES) of TiCl4/O2 DBD plasmas at various power supply driving frequencies are presented.
机译:低压介电势垒放电(DBD)TiCl4 / O2和N2等离子体已用于在不同的电源驱动频率下沉积氧化钛膜。使用自制的大面积低压DBD反应器,其特点是实验设置简单,进料气和电耗低,并且易于操作。原子力显微镜,扫描电子显微镜,能量分散光谱和接触角测量已用于表征沉积膜。实验结果表明,所有沉积的薄膜均一且亲水,接触角约为15°。与在TiCl4 / O2混合气体中沉积的氧化钛薄膜相比,在TiCl4 / O2 / N2混合气体中的氧化钛膜更加稳定。在添加50%N2和20%TiCl4的TiCl4 / O2 / N2混合气体中,氧化钛膜的接触角仍小于20°,而未掺杂的氧化钛膜的接触角在测量后大于64°。一周。低压TiCl4 / O2等离子体由脉冲辉光状放电组成,其峰值宽度为几微秒,这导致氧化钛膜的均匀沉积。由于过高的膜应力,使膜厚度增加数百纳米会导致膜破裂。给出了TiCl4 / O2 DBD等离子体在各种电源驱动频率下的光发射光谱(OES)。

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