首页> 外文OA文献 >Comment on 'A case study on the scaling of 1/f noise: La2/3Sr1/3MnO3 thin films' J. Appl. Phys. 113, 094901 (2013)
【2h】

Comment on 'A case study on the scaling of 1/f noise: La2/3Sr1/3MnO3 thin films' J. Appl. Phys. 113, 094901 (2013)

机译:评论“1 / f噪声结垢的案例研究:La2 / 3sr1 / 3mnO3薄膜”J.申请物理学。 113,094901(2013)

摘要

The problem of non-standard scaling of the 1/f noise in thin manganite films was revisited in the above paper, suggesting the quantum theory of fundamental flicker noise for the interpretation of the unusual dependence of the normalized Hooge parameter on the sample volume. Experimental evidence has been reported, showing that in these materials such volume dependence is, instead, an artifact of extrinsic noise sources, e.g., contact noise. Moreover, the proposed theoretical model implies a linear temperature dependence of the Hooge parameter, which is against the experimental data reported here. Based on these arguments, it is possible to conclude that the quantum theory of fundamental flicker noise cannot be applied to the case of La2∕3Sr1∕3MnO3 thin films.
机译:上面的论文再次探讨了锰薄膜薄膜中1 / f噪声的非标定标度问题,提出了基本闪烁噪声的量子理论,用于解释归一化的Hooge参数对样品量的异常依赖性。已经报道了实验证据,表明在这些材料中,这种体积依赖性反而是外部噪声源的伪影,例如接触噪声。此外,提出的理论模型暗示了Hooge参数的线性温度依赖性,这与此处报告的实验数据相反。基于这些论点,可以得出结论,基本闪烁噪声的量子理论不能应用于La2 ∕ 3Sr1 ∕ 3MnO3薄膜的情况。

著录项

相似文献

  • 外文文献
  • 中文文献

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号